GPIO: General purpose input output, controllable at run time 通用输入输出,运行时可控
Gray code: Binary system where successive values differ by one bit 格雷码:连续值相差一位的二进制系统
HBM: High bandwidth memory 高带宽内存
I2C: Multi-master 2 wire bus 多主机 2 线总线
LAN: Local area network 局域网
LFSR: Linear feedback shift register 线性反馈移位寄存器
LSB: Least significant bit 最低有效位
[LUT] (https://en.wikipedia.org/wiki/Lookup_table): An array that replaces runtime computation with a simpler array indexing operation 查找表(LUT) 是一个数组,它用更简单的数组索引操作代替运行时计算。
DV: Design verification is the process of verifying that the logic design conforms to specification. 设计验证是验证逻辑设计是否符合规范的过程
ECO: Engineering change order 工程变更单
EDA: Electronic Design Automation tools used to enhance chip design productivity. 用于提高芯片设计生产力的电子设计自动化工具
EDA companies: List of EDA companies EDA 公司
Electromigration: Transport of material caused by the gradual movement of the ions in a conductor. 由导体中的离子逐渐运动引起的物质传输。
EMI: Electromagnetic interference. 电磁干扰
ESD: Electrostatic discharge is the sudden flow of electricity between two electrically charged objects. 静电放电是两个带电物体之间的突然电流流动
Fabless: The design and sale of semiconductor devices while outsourcing the manufacturing to 3rd party. 半导体设备的设计和销售,同时将制造外包给第三方-无晶圆制造是硬件设备和半导体芯片的设计和销售,同时将其制造(或晶圆厂)外包给称为半导体代工厂的专业制造商.
FEOL: Front end of line processing. Includes all chip processing up to but not including metal interconnect layers. 生产线前端处理。包括所有芯片处理,但不包括金属互连层。
Flip-flop: A clocked circuit that has two stable states and can be used to store state information. 触发器
Foundry: Semiconductor company offering manufacturing services. 提供制造服务的半导体公司
Full custom design: Design methodology involving layout and interconnection of individual transistors. 完全定制设计-涉及各个晶体管的布局和互连的设计方法
GDSII: Binary format of design database sent to foundry. 发送制造厂的设计数据库的二进制格式
HDL: Specialized hardware description lanaguage for describing electronic circuits. 用于描述电子电路的专用硬件描述语言
Hold time: Minimum time synchronous input should hold steady after clock event. 时钟事件后同步输入应保持稳定的最短时间
PDK: Process design kits consisting of a minimum set of files needed to design in a specific process. 流程设计工具包,包含在特定流程中进行设计所需的最少文件集
Power gating: Technique used to reduce leakage/standby power by shutting of the supply to the circuit. 电源门控:用于通过关闭电路电源来减少泄漏/待机功率的技术
P&R: Automated Place and Route of a circuit using an EDA tool. 使用 EDA 工具自动布局和布线电路
PVT Corners: Represents the extreme process, voltage, temperature that could occur in a given semiconductor process. 表示给定半导体工艺中可能出现的极端工艺、电压、温度
Radiation Hardening: Act of making devices resistant to damage caused by ionizing radiation. 辐射硬化是使电子元件和电路能够抵抗由高水平电离辐射(粒子辐射和高能电磁辐射)引起的损坏或故障的过程
RTL: Design abstraction for digital circuit design. 寄存器传输级( RTL ) 是一种设计抽象,它根据硬件寄存器之间的数字信号(数据)流以及对这些信号执行 的逻辑操作对同步 数字电路进行建模
Setup time: Minimum time synchronous input should be ready before clock event. 建立时间-最小时间同步输入应在时钟事件之前准备好
SEU: Change of state caused by one single ionizing particle (ions, electrons, photons...). 由单个电离粒子(离子、电子、光子......)引起的状态变化
Signoff: The final approval that the design is ready to be sent to foundry for manufacturing. signoff(也写为sign-off )检查是设计在流片之前必须通过的一系列验证步骤的总称
SOC: System On Chip 片上系统
Spice: Open source analog electronic circuit simulator. 开源模拟电子电路模拟器
STA: Method of computing the expected timing of a digital circuit without requiring full circuit simulation. 静态时序分析(STA)
Standard Cell Design: Design process relying on a fixed set of standard cells. 标准单元设计-设计过程依赖于一组固定的标准单元
Subthreshold Leakage: Current between source and drain in MOSFET when transistor is "off". 亚阈值泄漏-晶体管“关闭”时 MOSFET 源极和漏极之间的电流
Synchronous logic: Logic whose state is controlled by a synchronous clock. 同步逻辑
Synthesis: Translation of high level design description (e.g. Verilog) to a netlist format (e.g. standard cell gate level). 综合-将高级设计描述(例如 Verilog)转换为网表格式(例如标准单元门级)
SystemC: Set of C++ classes and macros for simulation. Commonly used for high level modeling and testing. 一组用于模拟的 C++ 类和宏。常用于高级建模和测试
Tape-out: Act of sending photomask chip database ("layout") to the manufacturer. 流片:将光掩模芯片数据库(“布局”)发送给制造商的行为。
TCL: Scripting language used by most of the leading EDA chip design tools. 大多数领先的 EDA 芯片设计工具使用的脚本语言。
Transistor: A semiconductor device used to amplify/switch electronic signals. 晶体管
Verilog: The dominant hardware description language (HDL) for chip design. 用于芯片设计的主要硬件描述语言 (HDL)
VLSI: Very large Integrated Circuit (somewhat outdated term, everything is VLSI today). 大的集成电路(有点过时的术语,今天一切都是 VLSI)
Von Neumann architecture: Computer architecture in which instructions and data are stored in the same memory. 冯诺依曼架构:指令和数据存储在同一内存中的计算机架构。
Manufacturing制造业
BEOL: Back end of line processing for connecting together devices using metal interconnects. 使用金属互连将设备连接在一起的生产线后端处理。
Dicing: Act of cutting up wafer into individual dies. 切割-将晶圆切割成单个裸片的行为
FinFet: Non planar, double-gate transistor. 非平面双栅晶体管
Photo-lithography: Process used in micro-fabrication to pattern parts of a thin film or the bulk of a substrate. 光刻:用于微制造的工艺,用于对薄膜的部分或基板的主体进行图案化。
Photomasks: Opaque plates with holes or transparencies that allow light to shine through in a defined pattern. 光掩模:带有孔或透明胶片的不透明板,可让光线以规定的图案透过。
Reticle: A set of photomasks used by a stepper to step and print patterns onto a silicon wafer. 标线:步进机使用的一组光掩模,用于在硅晶片上步进和打印图案。
Semiconductor Fabrication: Process used to create the integrated circuits. 半导体制造:用于制造集成电路的工艺。
Silicon: Element (Si), forms the basis of the electronic revolution. 硅:元素 (Si),构成电子革命的基础。
Silicon on insulator: Layered silicon–insulator–silicon with reduced parasitic capacitance. 绝缘体上硅:具有降低寄生电容的层状硅-绝缘体-硅。
Stepper: Machine that passes light through reticle onto the silicon wafer being processed. 步进器:将光通过标线板传递到正在处理的硅晶片上的机器。
TSV: Vertical electrical connection (via) passing completely through a silicon wafer or die. 硅通孔( TSV ) 或芯片通孔是完全穿过硅晶片或芯片的垂直电连接(通孔)。
Wafer: Thin slice of semiconductor material used in electronics for the fabrication of integrated circuits. 晶片:用于制造集成电路的电子器件中的半导体材料薄片。
Wafer thinning: Wafer thickness reduction to allow for stacking and high density packaging. 晶圆减薄:晶圆厚度减小以允许堆叠和高密度封装。
Packaging封装
3D IC's: The process of stacking integrated circuits and connecting them through TSVs. 通过堆叠硅晶片或裸片并使用例如硅通孔(TSV) 或 Cu-垂直互连
BGA: Ball grid array is a type of surface-mount packaging (a chip carrier) used for integrated circuits. 球栅阵列是一种用于集成电路的表面贴装封装(芯片载体)
BGA substrate: A miniaturized PCB that mates the silicon die to BGA pins. 将硅芯片与 BGA 引脚配对的小型化 PCB
Bumping: Placing of bumps on wafer/dies in preparation for package assembly. 凸块:在晶圆/裸片上放置凸块,为封装组装做准备。
DIMM: Dual in line memory module. 双列直插内存模块。
Flip-chip: Method of bonding a silicon die to package using solder bumps. 使用焊料凸点将硅芯片键合到封装上的方法。
IC Assembly: Semiconductor die is encased in a supporting case "package". IC 组装
Interposer: Electrical interface used to spread a connection to a wider pitch. 用于将连接扩展到更宽间距的电气接口
Heat sink: A passive heat exchanger. 散热器-被动式热交换器。
Heat pipe: Device for efficiently transferring heat between two solid interfaces . 热管-在两个固体界面之间有效传递热量的装置。
KGD: Known Good Die. Dies that have been completely tested at wafer probe. 晶圆测试是半导体器件制造过程中执行的一个步骤。在此步骤中,在将晶圆发送到芯片准备之前执行,晶圆上存在的所有单个集成电路都通过对其应用特殊的测试模式来测试功能缺陷。
Leadframe: Metal structure inside a chip package that carry signals from the die to the outside. 引线框架:芯片封装内的金属结构,可将信号从芯片传送到外部。
POP: Package on Package
SIP: System In Package 系统封装
SMT: Technique whereby packaged chips are mounted directly onto the PCB surface. 封装芯片安装在 PCB 表面上的技术。
Through-hole: TPackage pins inserted in drilled holes and soldered on opposite side of the board. 通孔
Wirebond: Method of bonding a silicon die to a package using wires. 使用导线将硅芯片与封装结合的方法
WSI: Wafer scale integration 晶圆级集成
Test测试
Arbitrary Waveform Generator: Electronic instrument used to generate arbitrary signal waveforms. 任意波形发生器:用于产生任意信号波形的电子仪器。
ATE: Automatic Test Equipment for testing integrated circuits. 用于测试集成电路的自动测试设备。
Burn-in: Process of screening parts for potential premature life time failures. 老化:筛选零件以发现潜在的过早寿命故障的过程。
DIB: Device Interface Board for interfacing DUT to ATE. Also called DUT board, probe card, load board, PIB. 用于将 DUT 连接到 ATE 的设备接口板。也称为 DUT 板、探针卡、负载板、PIB。
DMM: Electronic instrument for measuring voltage, current, and resistance. 用于测量电压、电流和电阻的电子仪器。
DUT: Device under test 被测设备
FIB: Focused ion beam 聚焦离子束
JTAG: Industry standard for verifying and testing/debugging printed circuit boards after manufacturing. 制造后验证和测试/调试印刷电路板的行业标准。
Logic Analyzer: Electronic instrument for capturing multiple digital signal from a system. 逻辑分析仪:用于从系统中捕获多个数字信号的电子仪器。
MCM: Multi-chip Module 多芯片模块
Oscilloscope: Electronic instrument for tracking the change of an electrical signal over time. 示波器:跟踪电信号随时间变化的电子仪器。
Probe Card: A direct interface between electronic test systems and a semiconductor wafer. 探针卡:电子测试系统和半导体晶片之间的直接接口。
SEM: Scanning electron microscope 扫描电子显微镜
Shmoo Plot: An ASCII plot of a component response over a range of conditions. Shmoo 图:在一系列条件下组件响应的 ASCII 图。
Spectrum Analyzer: Electronic instrument for measuring the power of the spectrum of an unknown signal. 频谱分析仪:用于测量未知信号频谱功率的电子仪器。